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Volumn 23, Issue 7, 2000, Pages 1150-1155

Prospective postmarket device studies versus returned product analysis as a predictor of system survival

Author keywords

Adverse events; Chronic performance; Device survival; Monitoring; RPA

Indexed keywords

ARTICLE; DEFIBRILLATOR; GRAFT SURVIVAL; POSTMARKETING SURVEILLANCE; PROSTHESIS FAILURE; QUALITY CONTROL;

EID: 0033927030     PISSN: 01478389     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1540-8159.2000.tb00916.x     Document Type: Article
Times cited : (17)

References (19)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.