Thin block copolymers films: Film formation and corrugation under an AFM tip

Thin Solid Films

Volumn 358, Issue 1, 2000, Pages 234-240

  Maas, J H ^a   Cohen Stuart, M A ^a   Fleer, G J ^a  

^a WAGENINGEN UNIVERSITY   (Netherlands)

Author keywords

Atomic force microscopy; Block copolymers; Corrugation; Surface structures; Surfaces

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; FILM GROWTH; MATHEMATICAL MODELS; MOLECULAR ORIENTATION; MOLECULAR WEIGHT; POLYSTYRENES; SURFACE STRUCTURE; THIN FILMS; VINYL RESINS;

CORRUGATION; POLYVINYL PYRIDINE;

PLASTIC FILMS;

EID: 0033909302     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(99)00705-1     Document Type: Article

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