Implications of specimen preparation and of surface contamination for the measurement of ghe grain boundary carbon concentration of steels using x-ray microanalysis in an UHV FESTEM

Surface and Interface Analysis

Volumn 29, Issue 1, 2000, Pages 23-32

  Cousens, D R ^a   Wood, B J ^a   Wang, J Q ^a   Atrens, A ^a  

^a UNIVERSITY OF QUEENSLAND   (Australia)

Author keywords

Carbon; Specimen preparation; Surface contamination; XPS

Indexed keywords

CARBON; CLEANING; ETCHING; ION BEAMS; OXIDATION; PLASMA APPLICATIONS; SCANNING ELECTRON MICROSCOPY; STAINLESS STEEL; SURFACE TREATMENT; TRANSMISSION ELECTRON MICROSCOPY; VACUUM APPLICATIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

ION BEAM PROFILING; PLASMA CLEANING; VACUUM CHAMBERS;

SURFACE CHEMISTRY;

EID: 0033908792     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(200001)29:1<23::aid-sia689>3.0.co;2-y     Document Type: Article

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