Electron scattering correction of X-ray-excited Ni and Cu KLL Auger spectra emitted from thin and thick metallic samples

Surface and Interface Analysis

Volumn 29, Issue 2, 2000, Pages 126-130

  Cserny, K ^a,b   Werner, W S M ^a   Stori H ^a   Kover L ^b,c  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^c INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; ELECTRON SCATTERING; METALLIC FILMS; MOLYBDENUM; NICKEL; POLYCRYSTALLINE MATERIALS; PROBABILITY; THIN FILMS;

AUGER SPECTRA;

SILICON WAFERS;

EID: 0033907524     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(200002)29:2<126::AID-SIA704>3.0.CO;2-X     Document Type: Article

References (14)

1. Kövér L, Kovács Zs, Tóth J, Cserny I, Varga D. Surf. Sci. 1999; 433-435: 833.
2. Werner WSM. Surf. Interface Anal. 1995; 23: 737.
3. Tougaard S, Sigmund P. Phys. Rev. 1982; B25: 4452.
4. Tougaard S. Surf. Sci. 1989; 216: 343.
5. Staib P, Kirschner J. Appl. Phys. 1974; 3: 421.
6. Kövér L, Varga D, Cserny I, Tóth J, Tökési K. Surf. Interface Anal. 1992; 19: 9.
7. Werner WSM. Phys. Rev. 1995; B52: 2964.
8. Tilinin IS, Werner WSM. Surf. Sci. 1993; 290: 119.
9. Werner WSM. Phys. Rev. 1997; B55: 14925.
10. Palik ED. Handbook of Optical Constants of Solids. Academic Press: New York, 1985.
11. Penn DR. Phys. Rev. 1987; B35: 482.
12. Yates AC. Comp. Phys. Commun. 1971; 2: 175.
13. Bonham RA, Strand TG. J. Chem. Phys. 1963; 39: 2200.
14. Jansson C, Hansen HS, Yubero F, Tougaard S. J. Electron Spectrosc. Relat. Phenom. 1997; 60: 301.