SCOPUS 정보 검색 플랫폼

Volumn 60, Issue 4, 1992, Pages 301-319

Accuracy of the Tougaard method for quantitative surface analysis. Comparison of the Universal and REELS inelastic cross sections

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0004038418 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(92)80025-4 Document Type: Article

Times cited : (32)

References (26)

2
- 84955020249
- Formalism for quantitative surface analysis by electron spectroscopy
- (1990) Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films , vol.8 A , pp. 2197
- Tougaard¹

3
- 0003828439
- D. Briggs, M.P. Seah, Wiley, New York, Chapter 5
- (1990) Practical Surface Analysis , vol.1
- Seah¹

7
- 0026371472
- (1991) Surf. Interf. Anal. , vol.17 , pp. 911
- Tanuma¹ Powell² Penn³

8
- 0026401803
- (1991) Surf. Interf. Anal. , vol.17 , pp. 927
- Tanuma¹ Powell² Penn³

9
- 0001576082
- (1987) Phys. Rev. B , vol.35 , pp. 6570
- Tougaard¹ Chorkendorff²

13
- 0010445638
- Background correction in XPS: Comparison of validity of different methods
- (1992) Surface and Interface Analysis , vol.19 , pp. 171
- Tougaard¹ Jansson²

21
- 0003828439
- D. Briggs, M.P. Seah, Wiley, New York, Appendix 3
- (1990) Practical Surface Analysis , vol.1
- Sherwood¹

23
- 84921168299
- M.P. Seah, XPS: Reference Procedure for the Accurate Intensity Calibration of Electron Spectrometers — Results of a BCR Intercomparison Co-Sponsored by the VAMAS SCA TWP (BCR contract 5276/1/4/343/89/11-BCR UK, 30), 1992

24
- 6244274420
- Validity of background correction algorithms studied by comparison with theory of synchrotron-radiation-excited core levels and their corresponding auger peak intensities
- (1992) Surface and Interface Analysis , vol.19 , pp. 217
- Jansson¹ Hansen² Jung³ Braun⁴ Tougaard⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.