External field coupling to MTL networks with nonlinear junctions: Numerical modeling and experimental validation

IEEE Transactions on Electromagnetic Compatibility

Volumn 42, Issue 1, 2000, Pages 16-28

  Lapohos, Tibor ^a,b   LoVetri, Joe ^a,c   Seregelyi, Joe ^a,b  

^a IEEE

^b DEPARTMENT OF NATIONAL DEFENCE   (Canada)

^c UNIVERSITY OF MANITOBA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC WAVE INTERFERENCE; INDUCED CURRENTS; MATHEMATICAL MODELS; NONLINEAR NETWORK ANALYSIS; PERMITTIVITY; PERTURBATION TECHNIQUES; PRINTED CIRCUITS; SURFACE WAVES; TIME DOMAIN ANALYSIS;

MULTICONDUCTOR TRANSMISSION LINE (MTL) NETWORKS; NONLINEAR JUNCTIONS;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0033907413     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.831701     Document Type: Article

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