Preparation of TEM-specimens using focused ion beam (FIB) systems;Zielpraeparation von TEM-Proben mit dem fokussierten Ionenstrahl (FIB)

Praktische Metallographie/Practical Metallography

Volumn 37, Issue 2, 2000, Pages 90-101

  Spolenak, Ralph ^a   Heiland, Birgit ^a   Witt, Christian ^a   Keller, Rose Marie ^a   Müllner, Peter ^a   Arzt, Eduard ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ION BEAMS; SPECIMEN PREPARATION; TRANSMISSION ELECTRON MICROSCOPY;

FOCUSED ION BEAM (FIB);

MATERIALS SCIENCE; ION BEAMS;

CONVENTIONAL METHODS; FOCUSED-ION-BEAM SYSTEM; NANOMETRES;

EID: 0033906526     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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