Effects of microcrystalline silicon film structure on low-high-low band-gap thin film transistor

Materials Chemistry and Physics

Volumn 62, Issue 2, 2000, Pages 153-157

  Chang, Chun Yen ^a   Lee, Yeong Shyang ^a   Huang, Tiao Yuan ^a   Shih, Po Sheng ^a   Lin, Chiung Wei ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CRYSTALLINE MATERIALS; ELECTRIC CURRENTS; ELECTRON TUNNELING; ENERGY GAP; GATES (TRANSISTOR); INTERFACES (MATERIALS); SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; THRESHOLD VOLTAGE;

MICROCRYSTALLINE SILICON;

THIN FILM TRANSISTORS;

EID: 0033906294     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(99)00174-1     Document Type: Article

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