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Volumn 482, Issue 2, 2000, Pages 202-210

Electrodissolution of Ti and p-Si in acidic fluoride media: Formation ratio of oxide layers from electrochemical impedance spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPOSITION EFFECTS; DISSOLUTION; ELECTRIC POTENTIAL; ELECTRIC RESISTANCE; ELECTROLYTIC POLISHING; HYDROFLUORIC ACID; PH EFFECTS; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SPECTROSCOPY; TITANIUM DIOXIDE;

EID: 0033902694     PISSN: 00220728     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(00)00050-4     Document Type: Article
Times cited : (48)

References (35)
  • 32
    • 0003957648 scopus 로고
    • in: H. Eyring, D. Henderson, W. Jost (Eds.), Academic, New York, Ch. 5
    • H. Gerischer, in: H. Eyring, D. Henderson, W. Jost (Eds.), Physical Chemistry, vol. 9, Academic, New York, 1970, Ch. 5.
    • (1970) Physical Chemistry , vol.9
    • Gerischer, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.