메뉴 건너뛰기




Volumn 161, Issue , 2000, Pages 510-514

Ion beam analysis of interface reactions in magnetite and maghemite thin films

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; DIFFUSION IN SOLIDS; MAGNETITE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION;

EID: 0033902324     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00701-6     Document Type: Article
Times cited : (7)

References (16)
  • 5
    • 85031615540 scopus 로고
    • D.R. Randell, W. Neagle (Eds.), Special Publication 84, Royal Society of Chemistry, London
    • R.K. Wild, in: D.R. Randell, W. Neagle (Eds.), Surface Analysis: Techniques and Applications, Special Publication 84, Royal Society of Chemistry, London, 1990.
    • (1990) Surface Analysis: Techniques and Applications
    • Wild, R.K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.