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Volumn 161, Issue , 2000, Pages 510-514
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Ion beam analysis of interface reactions in magnetite and maghemite thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHEMICAL ANALYSIS;
CHEMICAL REACTIONS;
DIFFUSION IN SOLIDS;
MAGNETITE;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
THIN FILMS;
X RAY DIFFRACTION;
CHANNELING;
INTERFACE REACTIONS;
ION SCATTERING;
MAGHEMITE;
MAGNESIOFERRITE;
ION BEAMS;
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EID: 0033902324
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)00701-6 Document Type: Article |
Times cited : (7)
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References (16)
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