XPS and ellipsometric characterization of zinc-BTA complex

Journal of Electronic Materials

Volumn 29, Issue 4, 2000, Pages 463-467

  Sirtori, V ^a   Zambon, F ^a   Lombardi, L ^a  

^a IBM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ALCOHOLS; COMPUTATIONAL METHODS; CORROSION PROTECTION; ELLIPSOMETRY; NITROGEN COMPOUNDS; OXIDATION RESISTANCE; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC COMPOUNDS;

BENZOTRIAZOLE;

ORGANOMETALLICS;

EID: 0033902294     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-000-0162-9     Document Type: Article

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