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Volumn 265, Issue 1, 2000, Pages 125-132

Electronic and optical investigation of hydrogenated amorphous carbon (a-C:H) by X-ray photoemission spectroscopy and spectroscopic ellipsometry

(4) Hong, Junegie a Lee, Soonil b Cardinaud, Christophe a Turban, Guy a

a INSTITUT DES MATÉRIAUX JEAN ROUXEL (France)

b Ajou University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELECTRIC POTENTIAL; ELECTRON CYCLOTRON RESONANCE; ELECTRON TRANSITIONS; ELECTRONIC DENSITY OF STATES; ELLIPSOMETRY; HYDROGENATION; METHANE; PHOTOEMISSION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPECTROSCOPIC ANALYSIS;

X RAY PHOTOEMISSION SPECTROSCOPY;

AMORPHOUS FILMS;

EID: 0033901945 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(99)00897-2 Document Type: Article

Times cited : (39)

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