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Volumn 198-200, Issue PART 2, 1996, Pages 641-645

The density of states of ta-C, ta-C:H and a-C:H as determined by X-ray excited photoelectron spectroscopy and molecular dynamics calculation

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CHEMICAL VAPOR DEPOSITION; CRYSTAL ATOMIC STRUCTURE; ELECTRON ENERGY LEVELS; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; MODIFICATION; MOLECULAR DYNAMICS; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

EID: 0030563222     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00780-6     Document Type: Article
Times cited : (2)

References (10)
  • 1
    • 0001953731 scopus 로고
    • Properties and characterization of amorphous carbon films
    • ed. J.J. Pouch and S.A. Alterovitz, Transtech Publications, Aedermannsdorf
    • P. Koidl, Ch. Wild, B. Dischler, J. Wagner and M. Ramsteiner, in: Properties and Characterization of Amorphous Carbon Films, ed. J.J. Pouch and S.A. Alterovitz, Mater. Sci. Forum 52-53 (Transtech Publications, Aedermannsdorf, 1989) p. 41.
    • (1989) Mater. Sci. Forum , vol.52-53 , pp. 41
    • Koidl, P.1    Wild, Ch.2    Dischler, B.3    Wagner, J.4    Ramsteiner, M.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.