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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 1, 2000, Pages 109-113

Electrical and structural characterizations of Cu(InGa)Se2 thin films using electrochemical capacitance-voltage method and focused-ion beam process

(3) Shimizu, Akira a Yamada, Akira a Konagai, Makoto a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; CHARACTERIZATION; ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; ELECTROCHEMISTRY; FILM GROWTH; ION BEAMS; STRUCTURE (COMPOSITION);

CARRIER CONCENTRATION PROFILING; COPPER INDIUM GALLIUM SELENIDE; ELECTROCHEMICAL CAPACITANCE VOLTAGE METHOD; FOCUSED ION BEAM PROCESS; SELENIZATION;

THIN FILMS;

EID: 0033901796 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.39.109 Document Type: Article

Times cited : (7)

References (8)

1
- 0030408308
- J. R. Tuttle, J. S. Ward, A. Duda, T. A. Berens, M. A. Contreras, K. R. Ramamnathan, A. L. Tennant, J. Keane, E. D. Cole, K. Emery and R. Noufi: Mater. Res. Soc. Symp. Proc. 426 (1996) 143.
- (1996) Mater. Res. Soc. Symp. Proc. , vol.426 , pp. 143
- Tuttle, J.R.¹ Ward, J.S.² Duda, A.³ Berens, T.A.⁴ Contreras, M.A.⁵ Ramamnathan, K.R.⁶ Tennant, A.L.⁷ Keane, J.⁸ Cole, E.D.⁹ Emery, K.¹⁰ Noufi, R.¹¹

2
- 0030411049
- T. Negami, M. Nishitani, N. Kohara, Y. hashimoto and T. Wada: Mater. Res. Soc. Symp. Proc. 426 (1996) p. 1451.
- (1996) Mater. Res. Soc. Symp. Proc. , vol.426 , pp. 1451
- Negami, T.¹ Nishitani, M.² Kohara, N.³ Hashimoto, Y.⁴ Wada, T.⁵

3
- 0343513810
- K. Kushiya, I. Sugiyama, M. Tachiyuki, T. Kase, Y. Nagoya, D. Okumura, M. Sato, O. Yamase and H. Takeshita: Proc. 9th Int. PVSEC (1996) p. 143.
- (1996) Proc. 9th Int. PVSEC , pp. 143
- Kushiya, K.¹ Sugiyama, I.² Tachiyuki, M.³ Kase, T.⁴ Nagoya, Y.⁵ Okumura, D.⁶ Sato, M.⁷ Yamase, O.⁸ Takeshita, H.⁹

4
- 0002075192
- H. S. Ullal, K. Zweibel and B. von Reodern: Proc. 26th PVSC (1997) p. 301.
- (1997) Proc. 26th PVSC , pp. 301
- Ullal, H.S.¹ Zweibel, K.² Von Reodern, B.³

5
- 0002878738
- T. Ambridge and D. J. Ashen: Electron. Lett. 15 (1979) 674.
- (1979) Electron. Lett. , vol.15 , pp. 674
- Ambridge, T.¹ Ashen, D.J.²

6
- 0342643529
- S. Y. Wang, F. Hara, J. Simpson, H. Stewart, J. M. Wallace, K. A. Prior and B. C. Canvenett: Appl. Phys. Lett. 60 (1992) 344.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 344
- Wang, S.Y.¹ Hara, F.² Simpson, J.³ Stewart, H.⁴ Wallace, J.M.⁵ Prior, K.A.⁶ Canvenett, B.C.⁷

7
- 0017958738
- M. M. Faktor and J. L. Stevenson: J. Electrochem. Soc. 125 (1978) 621.
- (1978) J. Electrochem. Soc. , vol.125 , pp. 621
- Faktor, M.M.¹ Stevenson, J.L.²

8
- 33645040586
- PN 4200 Poltroon's Semiconductor Profiler, Instruction Manual, Bio-Rad, Richmond, CA, USA
- PN 4200 Poltroon's Semiconductor Profiler, Instruction Manual, Bio-Rad, Richmond, CA, USA.

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