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Materials Science and Engineering B: Solid-State Materials for Advanced Technology

Volumn 69, Issue , 2000, Pages 386-391

Structural evolution of SnO2-TiO2 nanocrystalline films for gas sensors

(13) Edelman, Felix a Hahn, Horst b Seifried, Stefan c Alof, Christian d Hoche, Holger b Balogh, Adam c Werner, Peter d Zakrzewska, Katarzyna d Radecka, Marta a Pasierb, Pawel a Chack, Albert b Mikhelashvili, Vissarion c Eisenstein, Ghadi d

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY (Poland)

d TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; MOLECULAR BEAM EPITAXY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SILICA; SPUTTER DEPOSITION; SUBSTRATES; THIN FILMS; TIN COMPOUNDS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

SPINODAL DECOMPOSITION; TIN OXIDE;

NANOSTRUCTURED MATERIALS;

EID: 0033900504 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-5107(99)00282-2 Document Type: Article

Times cited : (46)

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