Layered nanoarchitecture of a fluorescent polyelectrolyte complex

Langmuir

Volumn 16, Issue 7, 2000, Pages 3221-3226

  Thünemann, Andreas F ^a   Ruppelt, Dirk ^a  

^a MAX PLANCK INSTITUTE OF COLLOIDS AND INTERFACES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM COMPOUNDS; CARBOXYLIC ACIDS; CRYSTAL MICROSTRUCTURE; CRYSTAL SYMMETRY; FLUORESCENCE; MULTILAYERS; NANOSTRUCTURED MATERIALS; OPTICAL FILMS; PLASTIC FILMS; POLYETHYLENES; THERMAL EFFECTS;

MESOMORPHOUS STRUCTURE;

POLYELECTROLYTES;

EID: 0033898635     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9913396     Document Type: Article

References (30)

1. Grell, M.; Bradly D. C. Adv. Mater. 1999, 11, 895.
2. Fiesel, R.; Halkyard, C. E.; Rampey M. E.; Kloppenburg, L.; Studer-Martinez, S. L.; Scherf, U.; Bunz, U. H. F. Macromol. Rapid Commun. 1999, 20, 107.
3. Ober, C.; Wegner, G. Macromolecules 1997, 9, 117.
4. Thünemann A. F. Polym. Int., in press.
5. Neher, D. Adv. Mater. 1995, 7, 691.
6. Kraft, A,; Grimsdale, A. C.; Holmes, A. B. Angew. Chem. 1998, 37, 403.
7. Hide, F.; Diaz-Garcia, M. A.; Schwartz, B. J.; Heeger, A. J. Acc. Chem. Res. 1997, 30, 430.
8. Pei, Q. B.; Yu, G.; Zhang, C.; Yang, Y.; Heeger, A.J. Science 1995, 269, 1086.
9. Halkyard, C. E.; Rampey, M. E.; Kloppenburg, L.; Studer-Martinez, S. L.; Bunz, H. F. Macromolecules 1998, 31, 8655.
10. Häger, H.; Heitz, W. Macromol. Chem. Phys. 1998, 199, 1821.
11. Schnablegger, H.; Antonietti, M.; Göltner, C.; Hartmann, J.; Cölfen, H.; Samori, P.; Rabe, J. P.; Häger, H.; Heitz, W. J. Colloid Interface Sci. 1999, 212, 24.
12. Thünemann, A. F. Adv. Mater. 1999, 11, 127.
13. Antonietti, M.; Conrad, J.; Thünemann, A. F. Macromolecules 1994, 27, 6007.
14. Wolff, T.; Burger, C.; Ruland, W. Macromolecules 1994, 27, 3301.
15. In Hosemann, R.; Bagchi, S. N. Direct Analysis of Diffraction by Matter; North-Holland Publishing Co.: Amsterdam, The Netherlands, 1962.
16. In Klug, H. P.; Alexander, L. E. X-ray diffraction procedures for polycrystalline and amorphous materials, 2nd ed.; Wiley-Interscience Publications: New York, 1974.
17. Ruland, W. Acta Crystallogr. 1967, 22, 615.
18. Ruland, W.; Tompa, H. Acta Crystallogr. 1968, 24, 93.
19. Berlepsch, H.; Burger, C.; Dautzenberg, H. Phys. Rev., E 1998, 58, 7549.
20. Antonietti, M.; Kaul, A.; Thünemann, A. F. Langmuir 1995, 11, 2638.
21. Antonietti, M.; Wenzel, A.; Thünemann, A. F. Langmuir 1996, 12, 2111.
22. Goetz R.; Helfrich, W. J. Phys. II 1996, 6, 215.
23. Müller M.; Schick, M. J. Chem. Phys. 1996, 105, 8282.
24. Goetz R.; Gompper, G.; Lipowsky, R. Phys. Rev. Lett. 1999, 82, 221.
25. Holy, V.; Pietsch U.; Baumbach, T. In Springer Tracts in Modern Physics, Vol. 149: High-Resolution X-ray Scattering from Thin Films and Multilayers; Springer: Berlin, 1999.
26. Reiter G.; Sharma A.; Casoli, A.; David, M.-O.; Khanna, R.; Auroy, P. Langmuir 1999, 15, 2551.
27. Vandenbrouck F.; Valignat M. P.; Cazabat, A. M. Phys. Rev. Lett. 1999, 82, 2693.
28. Sheiko, S.; Lermann, E.; Möller, M. Langmuir 1996, 12, 4015.
29. Neher, D Adv. Mater. 1995, 7, 691.
30. Kloppenburg, L.; Jones, D.; Claridge, J. B.; Loye, H.-C.; Bunz U. H. F. Macromolecules 1999, 32, 4460.