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1 Because any adventitious contaminants on the surface are typically displaced by the monolayer, ellipsometry can underestimate its thickness. Because the Au substrates were plasma cleaned immediately before a sequence of Cu upd and ellipsometric characterization, the Au/Cu(upd) samples used here likely had a lower level of adsorbed contaminants than substrates used in other studies without plasma cleaning. Consequently, the extent that substrate contamination would cause ellipsometry to underestimate the thickness of a monolayer should be less than that in other work.
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