Atom probe field-ion microscopy characterization of nickel and titanium aluminides

Materials Characterization

Volumn 44, Issue 1-2, 2000, Pages 159-176

  Larson, D J ^a   Miller, M K ^a  

^a Microsc Microanalytical Sci Grp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING ELEMENTS; CRYSTAL IMPURITIES; CRYSTAL MICROSTRUCTURE; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; ION MICROSCOPES; NICKEL ALLOYS; PRECIPITATION (CHEMICAL); SEGREGATION (METALLOGRAPHY); SOLUBILITY; TITANIUM ALLOYS;

ATOM PROBE FIELD ION MICROSCOPY; NICKEL ALUMINIDES; TITANIUM ALUMINIDES;

MICROSCOPIC EXAMINATION;

EID: 0033896570     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(99)00049-2     Document Type: Article

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