Atom Probe Field Ion Microscopy of Poly Synthetically Twinned Titanium Aluminide

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 102-103

  Larson, D J ^a   Miller, M K ^a   Inui, H ^b   Yamaguchi, M ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22444453385     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600020638     Document Type: Article

References (3)

1. H. Inui et al., Acta Metall. et Mater. 40 (1992) 3095.
2. H. Inui et al., Phil. Mag. A 74 (1996) 451.
3. This research was sponsored by the Division of Materials Sciences, U. S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp. and by an appointment (DJL) to the Oak Ridge National Laboratory (ORNL) Postdoctoral Research Associates Program administered jointly by the Oak Ridge Institute for Science and Education and ORNL. This research was conducted utilizing the Shared Research Equipment (SHaRE) User Program facilities at ORNL.