Nb on (110) TiO2 (rutile): Growth, structure, and chemical composition of the interface

Surface Science

Volumn 446, Issue 3, 2000, Pages 219-228

  Marien, J ^a   Wagner, T ^a   Duscher, G ^b   Koch, A ^c   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b VANDERBILT UNIVERSITY   (United States)

^c Wacker Siltronic Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION EFFECTS; CRYSTAL ORIENTATION; ELECTRON ENERGY LOSS SPECTROSCOPY; METALLIC FILMS; MOLECULAR BEAM EPITAXY; NIOBIUM; OXIDATION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; THIN FILMS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY;

RUTILE;

INTERFACES (MATERIALS);

EID: 0033896076     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01172-3     Document Type: Article

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