Shallow electron traps induced by [Ru(CN)6]4- in AgCl microcrystals: A computer simulation study of transient microwave photoconductivity

Journal of Physics D: Applied Physics

Volumn 33, Issue 5, 2000, Pages 564-573

  Hua, J P ^a   Callens, F ^a   Cardon, F ^a   De Meyer, H ^a   Vandenbroucke, D ^b  

^a GHENT UNIVERSITY   (Belgium)

^b AGFA GEVAERT N V   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTALLINE MATERIALS; HOLE TRAPS; PHOTOCONDUCTIVITY; RUTHENIUM COMPOUNDS; SEMICONDUCTING SILVER COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DOPING;

RUTHENIUM CARBONITRIDE; SILVER CHLORIDE;

ELECTRON TRAPS;

EID: 0033895908     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/5/312     Document Type: Article

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