Transient photoconductivity study of shallow electron traps in [Ru(CN)6]4- doped AgCl microcrystals: Effects of doping concentration and position

Imaging Science Journal

Volumn 47, Issue 2, 1999, Pages 71-79

  Hua, J P ^d   Callens, F ^a,c   Cardon, F ^d   Vandenbroucke, D ^b  

^a FUND FOR SCIENTIFIC RESEARCH   (Belgium)

^b R and D Laboratories   (Belgium)

^c GHENT UNIVERSITY   (Belgium)

^d NONE

Author keywords

AgCl microcrystals; Shallow electron traps; Transient photoconductivity

Indexed keywords

EID: 0033474948     PISSN: 13682199     EISSN: None     Source Type: Journal    
DOI: 10.1080/13682199.1999.11736457     Document Type: Article

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