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Volumn 36, Issue 4, 2000, Pages 359-361

Planar GaAs MOSFET using wet thermally oxidized AlGaAs as gate insulator

Author keywords

[No Author keywords available]

Indexed keywords

ENCAPSULATION; ETCHING; GATES (TRANSISTOR); INSULATION; ION IMPLANTATION; LEAKAGE CURRENTS; SEMICONDUCTING GALLIUM ARSENIDE; THERMOOXIDATION; THRESHOLD VOLTAGE; TRANSCONDUCTANCE;

EID: 0033895125     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20000281     Document Type: Article
Times cited : (8)

References (11)
  • 1
  • 2
    • 0019023053 scopus 로고
    • Status of GaAs metal-oxide-semiconductor technology
    • MIMURA, T., and FUKUTA, M.: 'Status of GaAs metal-oxide-semiconductor technology', IEEE Trans. Electron Devices, 1980, 27, pp. 1147-1155
    • (1980) IEEE Trans. Electron Devices , vol.27 , pp. 1147-1155
    • Mimura, T.1    Fukuta, M.2
  • 3
    • 0016872367 scopus 로고
    • First anodicoxide GaAs MOSFETs based on easy technological process
    • BAYRAKTAROGLU, B., KOHN, E., and HARTNAGEL, H.L.: 'First anodicoxide GaAs MOSFETs based on easy technological process', Electron. Lett., 1976, 12, pp. 53-54
    • (1976) Electron. Lett. , vol.12 , pp. 53-54
    • Bayraktaroglu, B.1    Kohn, E.2    Hartnagel, H.L.3
  • 4
    • 0020159599 scopus 로고
    • Indirect plasma deposition of silicon dioxide
    • MEINERS, L.G.: 'Indirect plasma deposition of silicon dioxide', J. Vac. Sci. Technol., 1982, 21, pp. 655-658
    • (1982) J. Vac. Sci. Technol. , vol.21 , pp. 655-658
    • Meiners, L.G.1
  • 5
    • 0019608844 scopus 로고
    • Chemical composition and formation of thermal and anodic oxide/III-V compound semiconductor interfaces
    • WILSEN, C.W.: 'Chemical composition and formation of thermal and anodic oxide/III-V compound semiconductor interfaces', J. Vac. Sci. Technol., 1981, 19, pp. 279-289
    • (1981) J. Vac. Sci. Technol. , vol.19 , pp. 279-289
    • Wilsen, C.W.1
  • 8
    • 36449008101 scopus 로고
    • 1-x AsGaAs; metal-oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs
    • 1-x AsGaAs; metal-oxide semiconductor field effect transistors formed by lateral water vapor oxidation of AlAs', Appl. Phys. Lett., 1995, 66, pp. 2688-2690
    • (1995) Appl. Phys. Lett. , vol.66 , pp. 2688-2690
    • Chen, E.I.1    Holonyak N., Jr.2    Maranowski, S.A.3
  • 10
    • 0009597752 scopus 로고    scopus 로고
    • Photoluminescence study of hydrogenated aluminum oxide-semiconductor interface
    • SHI, S.S., HU, E.L., ZHANG, J.P., CHANG, Y.I., PARIKH, P., and MISHRA, U.: 'Photoluminescence study of hydrogenated aluminum oxide-semiconductor interface', Appl. Phys. Lett., 1997, 70, pp. 1293-1295
    • (1997) Appl. Phys. Lett. , vol.70 , pp. 1293-1295
    • Shi, S.S.1    Hu, E.L.2    Zhang, J.P.3    Chang, Y.I.4    Parikh, P.5    Mishra, U.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.