Effect of electric field on the migration of grain boundaries in alumina

Journal of the American Ceramic Society

Volumn 83, Issue 4, 2000, Pages 915-918

  Jeong, Jin Wook ^a   Han, Joo Hwan ^a   Kim, Doh Yeon ^b  

^a Yeungnam University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; ELECTROMIGRATION; ELECTROSTATICS; GRAIN BOUNDARIES;

GRAIN BOUNDARY MIGRATION;

ALUMINA;

EID: 0033893469     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01294.x     Document Type: Article

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