Raman spectroscopic and atomic force microscopic study of graphite ablation at 193 and 248 nm

Applied Surface Science

Volumn 154, Issue , 2000, Pages 22-28

  Mechler, Á ^a   Heszler, P ^b   Márton, Zs ^a   Kovacs M ^a   Szorenyi T ^b   Bor, Z ^a  

^a UNIVERSITY OF SZEGED   (Hungary)

^b RESEARCH GROUP ON LASER PHYSICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; ATOMIC FORCE MICROSCOPY; ETCHING; HEAT TREATMENT; LASER ABLATION; OXIDATION; PULSED LASER APPLICATIONS; PYROLYSIS; RAMAN SPECTROSCOPY; SURFACE TREATMENT;

LASER SURFACE TREATMENT;

GRAPHITE;

EID: 0033891190     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00473-0     Document Type: Article

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