Real-time RBS study of the reaction of Tb and Dy with SiO2

Applied Surface Science

Volumn 157, Issue 3, 2000, Pages 129-134

  Berning, G L P ^a   Theron, C C ^b   Swart, H C ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

^b NAC   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DEPOSITION; DYSPROSIUM; HIGH TEMPERATURE PROPERTIES; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON; TERBIUM;

SILICIDES;

SILICA;

EID: 0033890051     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00514-0     Document Type: Article

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