Uniaxial strain observed in solid/liquid interface during crystal growth from melted Si: A molecular dynamics study

Journal of Crystal Growth

Volumn 210, Issue 1, 2000, Pages 60-64

  Nishihira, Ken ^a   Munetoh, Shinji ^a   Motooka, Teruaki ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL DEFECTS; CRYSTAL GROWTH FROM MELT; CRYSTAL ORIENTATION; MOLECULAR DYNAMICS; PHASE INTERFACES; SEMICONDUCTOR GROWTH; STRAIN; TENSILE STRESS; THERMAL EXPANSION; THERMAL GRADIENTS;

GROWN-IN DEFECTS;

SILICON WAFERS;

EID: 0033886907     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00647-8     Document Type: Article

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