Application of degradation test data to advertisement of consumer electronic products

Reliability Engineering and System Safety

Volumn 67, Issue 3, 2000, Pages 317-320

  Sohn, So Young ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CONSUMER ELECTRONICS; DATA REDUCTION; LIFE CYCLE; MARKETING; PROBABILITY DISTRIBUTIONS; QUALITY ASSURANCE; RANDOM PROCESSES; SERVICE LIFE;

DEGRADATION TESTS; LIFE DISTRIBUTION;

RELIABILITY;

EID: 0033886886     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(99)00060-5     Document Type: Article

References (9)

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3. Sohn S.Y. Growth curve analysis applied to ammunition deterioration. Journal of Quality Technology. 27:1996;71-80.
4. Sohn S.Y. Monitoring declining quality of ammunition stockpile under step-stress. Naval Research Logistics. 41:1994;707-718.
5. Jensen F., Petersen N.E. Burn-in: an engineering approach to the design and analysis of burn-in procedures. 1982;Wiley, Chichester.
6. Jensen F. Electronic component reliability: fundamentals, modelling, evaluation, and assurance. 1995;Wiley, Chichester.
7. Brombacher A.C. Reliability by design: CAE techniques for electronic components and systems. 1992;Wiley, Chichester.
8. SAS. SAS/OR User's Manual. SAS Institute Inc. Cary, NC, 1992.
9. Sohn S.Y. Bayesian dynamic forecasting for attribute reliability. Computers in IE. 33:1997;741-744.