Bayesian dynamic forecasting for attribute reliability

Computers and Industrial Engineering

Volumn 33, Issue 3-4, 1997, Pages 741-744

  Sohn, So Young ^a  

^a Yonsei University   (South Korea)

Author keywords

Attribute Data; Beta Distribution; Logistic Regression; Reliability Growth and Decay; Uncertainty

Indexed keywords

ERROR ANALYSIS; FORMAL LOGIC; MATHEMATICAL MODELS; REGRESSION ANALYSIS; RELIABILITY; TECHNOLOGICAL FORECASTING;

BAYESIAN DYNAMIC FORECASTING; LOGISTIC REGRESSION;

PRODUCT DESIGN;

EID: 0031386401     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0360-8352(97)00236-2     Document Type: Article

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