Microstructure and absorption property of silver-black coatings

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 2 A, 2000, Pages 551-554

  Wang, Chih Ming ^a   Chen, Ying Chung ^a   Lee, Maw Shung ^b   Chen, Kun Jer ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES   (Taiwan)

Author keywords

Absorption; Deposition pressure; Porosity; Silver black coating; Surface morphology

Indexed keywords

ARGON; ELECTRIC CONDUCTIVITY; EVAPORATION; GRAIN SIZE AND SHAPE; LIGHT ABSORPTION; METALLIC FILMS; METALLOGRAPHIC MICROSTRUCTURE; MORPHOLOGY; NITROGEN; SILICA; SILICON; SILVER;

THERMAL EVAPORATION;

BLACK COATINGS;

EID: 0033885552     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.551     Document Type: Article

References (11)

1. A. Hadni and X. Gerboux: Infrared Phys. 30 (1990) 465.
2. L. Harris, D. Jeffries and B. M. Siegel: J. Appl. Phys. 19 (1948) 791.
3. L. Harris and J. K. Beasly: J. Opt. Soc. Am. 42 (1952) 134.
4. D. B. Betts, F. J. J. Clarke, L. J. Cox and J. A. Larkin: J. Phys. 18 (1985) 689.
5. W. Lang, K. Kuhl and H. Sandmaier: Sens. & Actual. A 34 (1992) 243.
6. W. R. Blevin and W. J. Brown: J. Sci. Instrum. 42 (1965) 385.
7. W. R. Blevin and J. Geist: Appl. Opt. 13 (1974) 1171.
8. Y. Hatanaka, S. Okamoto and R. Nishida: Jpn. J. Appl. Phys. 19 (1980) 563.
9. Y.P.Xu,R.S.Huang and G. A. Rigby: Sens. & Actual. A 37-38 (1993) 226.
10. J. J. Ho, Y. K. Fang, K. H. Wu, W. T. Hsieh, C. W. Chu, C. R. Huang, M. S. Ju and C. P. Chang: IEEE Electron Device Lett. 19 (1998) 189.
11. L. Harris, D. Jeffries and B. M. Siegel: J. Chem. Phys. 18 (1950) 261.