Computation of joint reliability importance of two gate events in a fault tree

Reliability Engineering and System Safety

Volumn 68, Issue 1, 2000, Pages 1-5

  Hong, J S ^a   Koo, H Y ^b   Lie, C H ^b  

^a Seoul National University of Science and Technology   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; STATISTICAL METHODS; TREES (MATHEMATICS);

FAULT TREES (FT); GATE EVENTS (GE); JOINT RELIABILITY IMPORTANCE (JRI);

RELIABILITY THEORY;

EID: 0033879911     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(99)00079-4     Document Type: Article

References (8)

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3. Hagstrom JN. Redundancy, substitutes, and complements in system reliability. Technical Report, College of Business Administration, University of Illinois, P.O. Box 4348, Chicago 60680, 1990.
4. Hennings W., Kuznetsov N. FAMOCUTN&CUTQN: programs for fast analysis of large fault trees with replicated and negated gates. IEEE Trans Reliab. 44:1995;368-376.
5. Hong J.S., Lie C.H. Joint reliability-importance of two edges in an undirected network. IEEE Trans Reliab. 42:1993;17-23.
6. Lee H.S., Lie C.H., Hong J.S. A computation method for evaluating importance-measures of gates in a fault tree. IEEE Trans Reliab. 46:1997;360-365.
7. Vesely W.E., Davis T.C. Two measures of risk importance and their application. Nuclear Safety. 68:1985;226-234.
8. Yang J.E., Han S.H., Park J.H., Jin Y.H. Analytic method to break logical loops automatically in PSA. Reliab Engng Syst Safety. 56:1997;101-105.