A computation method for evaluating importance-measures of gates in a fault tree

IEEE Transactions on Reliability

Volumn 46, Issue 3, 1997, Pages 360-365

  Lee, Hae Sang ^a,c   Lie, Chang Hoon ^a   Hong, Jung Sik ^b  

^a Samsung SDS   (South Korea)

^b Seoul National University   (South Korea)

^c Seoul National University of Science and Technology   (South Korea)

Author keywords

Dependency between gate events; Fault tree; Gate reliability importance; Replicated basic event

Indexed keywords

ALGORITHMS; STATISTICAL METHODS;

BIRNBAUM IMPORTANCE MEASURE;

LARGE SCALE SYSTEMS;

EID: 0031222503     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.664007     Document Type: Article

References (9)

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