Determination of lattice displacements in Se implanted InP by RBS and PIXE channeling experiments

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 515-519

  Schrempel, F ^a   Opfermann, T ^a   Wendler, E ^a   Wesch, W ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTING SELENIUM; SINGLE CRYSTALS; X RAY ANALYSIS;

CHANNELING; PARTICLE INDUCED X RAY EMISSION;

CRYSTAL LATTICES;

EID: 0033878916     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00779-X     Document Type: Article

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