Near-field optical recording by reflection-mode near-field scanning optical microscope: Submicron-sized marks and their thermodynamic stability

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 2 B, 2000, Pages 984-985

  Kim, Myong R ^a,b   Park, June Hyoung ^a   Jhe, Wonho ^a  

^a Seoul National University   (South Korea)

^b LG   (South Korea)

Author keywords

Near field optical recording; Phase change optical recording media; Reflection mode nsom; Submicron sized marks; Thermodynamic stability

Indexed keywords

CRYSTALLIZATION; INTERFACIAL ENERGY; LIGHT REFLECTION; MELTING; OPTICAL DISK STORAGE; OPTICAL MICROSCOPY; PHASE SHIFT; PHASE TRANSITIONS; READOUT SYSTEMS; SCANNING; THERMAL EFFECTS; THERMODYNAMIC STABILITY;

NEAR-FIELD SCANNING OPTICAL MICROSCOPE (NSOM); PHASE-CHANGE OPTICAL RECORDING;

OPTICAL RECORDING;

EID: 0033876264     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.984     Document Type: Article

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