|
Volumn 196, Issue , 1996, Pages 7-15
|
Near-field microscopies in the study of glass
a |
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMIC FORCE MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SENSORS;
SPECTROMETRY;
SURFACE STRUCTURE;
NEAR FIELD MICROSCOPY;
SURFACE SPECTROMETRY;
GLASS;
|
EID: 0030562684
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/0022-3093(95)00550-1 Document Type: Article |
Times cited : (5)
|
References (17)
|