Dispersion measurement of arrayed-waveguide gratings by Fourier transform spectroscopy

Electronics Letters

Volumn 36, Issue 4, 2000, Pages 338-339

  Gehler, J ^a   Spahn, W ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC DISPERSION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFEROMETERS; OPTICAL WAVEGUIDES; SPECTRUM ANALYSIS;

ARRAYED-WAVEGUIDE GRATINGS (AWG);

DIFFRACTION GRATINGS;

EID: 0033875375     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20000273     Document Type: Article

References (6)

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