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Volumn 279, Issue 1-3, 2000, Pages 98-101

Conductance distribution in granular metal films: A combined study by conducting atomic force microscopy and computer simulation

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CONDUCTIVE FILMS; ELECTRIC CONDUCTANCE; NANOSTRUCTURED MATERIALS; RESISTORS;

EID: 0033875277     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00679-1     Document Type: Article
Times cited : (5)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.