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Volumn 279, Issue 1-3, 2000, Pages 98-101
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Conductance distribution in granular metal films: A combined study by conducting atomic force microscopy and computer simulation
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CONDUCTIVE FILMS;
ELECTRIC CONDUCTANCE;
NANOSTRUCTURED MATERIALS;
RESISTORS;
CONDUCTING ATOMIC FORCE MICROSCOPY;
METAL-INSULATOR TRANSITION;
CERMETS;
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EID: 0033875277
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(99)00679-1 Document Type: Article |
Times cited : (5)
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References (16)
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