Optimisation of peak-to-background ratios in proton-induced X-ray analysis of material deposited on thin and thick backings

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 161, Issue , 2000, Pages 814-818

  Wittmaack, K ^a   Hietel, B ^a  

^a INSTITUTE OF EPIDEMIOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTRON ENERGY LEVELS; ELECTRONS; GRAPHITE; HELIUM; POLYMERS; PROTONS; SOLID STATE DEVICES; VACUUM;

BREMSSTRAHLUNG; PEAK TO BACKGROUND RATIOS; PIERCED FILTERS; POLYMER FILMS; PROTON INDUCED X RAY EMISSION SPECTROMETRY; SOLID STATE DETECTORS;

X RAY SPECTROSCOPY;

EID: 0033873287     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00939-8     Document Type: Article

References (6)

1. F. Folkmann, C. Gaarde, T. Huus, K. Kemp, Nucl. Instr. and Meth. 116 (1974) 467.
2. H. Halder, N. Menzel, B. Hietel, K. Wittmaack, Nucl. Instr. and Meth. B 150 (1999) 90.
3. N. Menzel, B. Hietel, M. Leirer, W. Szymczak, K. Wittmaack, Nucl. Instr. and Meth. B 150 (1999) 96.
4. B. Hietel, N. Menzel, K. Wittmaack, Nucl. Instr. and Meth. B 109/110 (1996) 139.
5. B. Hietel, K. Wittmaack, Nucl. Instr. and Meth. B 136-138 (1998) 831.
6. S.A.E. Johansson, J.L. Campbell, PIXE: A Novel Technique for Elemental Analysis, Wiley, Chichester, 1988.