Depth profiling of optical absorption in thin films via the mirage effect and a new inverse scattering theory. Part I: Principles and methodology

Applied Spectroscopy

Volumn 54, Issue 1, 2000, Pages 110-126

  Power, J F ^a   Fu, S W ^a   Schweitzer, M A ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

INVERSE PROBLEMS; LIGHT ABSORPTION; LIGHT SCATTERING; SPECTROSCOPY;

DEPTH PROFILING; PHOTOTHERMAL;

THIN FILMS;

EID: 0033873005     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702001948196     Document Type: Article

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