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Volumn 161, Issue , 2000, Pages 1085-1089
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Trench homogeneity in plasma immersion ion implantation
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRONS;
NEON;
PLASMA APPLICATIONS;
TWO DIMENSIONAL;
ELASTIC RECOIL DETECTION ANALYSIS;
PARTICLE IN CELL CALCULATIONS;
PLASMA IMMERSION ION IMPLANTATION;
ION IMPLANTATION;
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EID: 0033871242
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)00825-3 Document Type: Article |
Times cited : (13)
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References (12)
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