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Volumn 23, Issue 3, 2000, Pages 249-259

Field emission scanning electron microscopy (FESEM) entering the 21st century: Nanometer resolution and molecular topography of cell structure

Author keywords

Backscatter electron imaging; CryoSEM; Field emission SEM; High resolution SEM; Secondary electron imaging

Indexed keywords

TUNGSTEN;

EID: 0033859330     PISSN: 01478885     EISSN: None     Source Type: Journal    
DOI: 10.1179/his.2000.23.3.249     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.