Inference about misclassification probabilities from repeated binary responses

Biometrics

Volumn 56, Issue 3, 2000, Pages 706-711

  Fujisawa, Hironori ^a   Izumi, Shizue ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b RADIATION EFFECTS RESEARCH FOUNDATION   (Japan)

Author keywords

False negative error; False positive error; Latent class model; Parameter identifiability; Random effects model; Sensitivity; Serological data; Specificity

Indexed keywords

ERRORS; RANDOM PROCESSES;

BINARY RESPONSE; FALSE NEGATIVE ERRORS; FALSE POSITIVE; FALSE-POSITIVE ERROR; LATENT CLASS MODEL; PARAMETER IDENTIFIABILITY; RANDOM EFFECTS MODEL; SENSITIVITY; SEROLOGICAL DATA; SPECIFICITY;

RELIABILITY;

ARTICLE; DIAGNOSTIC ACCURACY; LABORATORY DIAGNOSIS; MATHEMATICAL ANALYSIS; MODEL; RELIABILITY; SEROLOGY;

EID: 0033844135     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0006-341X.2000.00706.x     Document Type: Article

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