Mapping concentration profiles within the diffusion layer of an electrode Part II. Potentiometric measurements with an ultramicroelectrode

Electrochemistry Communications

Volumn 2, Issue 4, 2000, Pages 248-253

  Amatore, Christian ^a   Szunerits, Sabine ^a   Thouin, Laurent ^a  

^a ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

Concentration profiles; Conproportionation; Nernst layer approximation; Potentiometry; Ultramicroelectrode

Indexed keywords

EID: 0002072044     PISSN: 13882481     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1388-2481(00)00016-3     Document Type: Article

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