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Volumn 7, Issue 1-2, 2000, Pages 75-87
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Thermal desorption of sodium atoms from thin SiO2 films
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Author keywords
[No Author keywords available]
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Indexed keywords
SILICON DIOXIDE;
SODIUM;
ARTICLE;
DESORPTION;
ELECTRON DIFFRACTION;
FILM;
PROBABILITY;
ROENTGEN SPECTROSCOPY;
STOICHIOMETRY;
THERMAL ANALYSIS;
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EID: 0033814648
PISSN: 0218625X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0218-625X(00)00011-7 Document Type: Article |
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Times cited : (54)
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References (27)
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