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Volumn 215, Issue 10, 2000, Pages 569-583

X-ray structure determination of quasicrystals - Limits and potentiality

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; CONFERENCE PAPER; CRYSTAL; ELECTRON; ENTROPY; RELIABILITY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0033794312     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (47)
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  • 21
    • 0007718540 scopus 로고
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  • 22
    • 26144446211 scopus 로고
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    • 0002077548 scopus 로고
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  • 31
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  • 38
    • 0009381984 scopus 로고    scopus 로고
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    • Physical Metallurgy (Eds. R. W. Cahn, P. Haasen) Elsevier Science BV
    • (1996) , pp. 372-411
    • Steurer, W.1
  • 41
    • 0001894039 scopus 로고    scopus 로고
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    • (1999) , pp. 51-89
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  • 42
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    • (2000)
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  • 44
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  • 46
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.