Correction of specimen absorption in X-ray diffuse scattering experiments with area-detector systems

Journal of Applied Crystallography

Volumn 33, Issue 1, 2000, Pages 35-48

  Scheidegger, Stefan ^a   Estermann, Michael Alexander ^a   Steurer, Walter ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURACY; ARTICLE; CALCULATION; CRYSTAL STRUCTURE; HOLOGRAPHY; LINEAR SYSTEM; PARAMETER; RADIATION SCATTERING; REDUCTION; X RAY DIFFRACTION;

EID: 0034480807     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899011929     Document Type: Article

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