Quantification of minor phases in growth kinetics experiments with powder X-ray diffraction

American Mineralogist

Volumn 85, Issue 9, 2000, Pages 1217-1222

  Hanchar, J M ^a   Nagy, K L ^a   Fenter, P ^a   Finch, R J ^a   Beno, D J ^a   Sturchio, N C ^a  

^a GEORGE WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM METALLOGRAPHY; GROWTH KINETICS; KAOLINITE; MIXTURES; OPTICAL SENSORS; SURFACE ANALYSIS; X RAY DIFFRACTION;

ATOMIC FORCE IMAGING; CONVENTIONAL APPROACH; KINETICS EXPERIMENTS; MINIMUM DETECTION LIMITS; POSITION-SENSITIVE DETECTORS; POWDER X RAY DIFFRACTION; SOLUTION COMPOSITION; X-RAY DIFFRACTION TECHNIQUES;

X RAY DETECTORS;

CLAY MINERAL; REACTION KINETICS; X-RAY DIFFRACTION;

EID: 0033789278     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-2000-8-915     Document Type: Article

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