Effects of thickness and composition on the resistivity of Cu-MgF2 cermet thin film resistors

Journal of Materials Science

Volumn 35, Issue 10, 2000, Pages 2557-2559

  Katumba, G ^a   Olumekor, L ^a  

^a UNIVERSITY OF ZIMBABWE   (Zimbabwe)

Author keywords

[No Author keywords available]

Indexed keywords

CERMETS; COMPOSITION EFFECTS; COPPER; ELECTRIC CONDUCTIVITY OF SOLIDS; EVAPORATION; MAGNESIUM COMPOUNDS; MATHEMATICAL MODELS; REGRESSION ANALYSIS; THICKNESS MEASUREMENT; THIN FILM DEVICES; VACUUM APPLICATIONS;

MAGNESIUM FLUORIDE;

RESISTORS;

EID: 0033752143     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004754710326     Document Type: Article

References (11)

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