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Volumn 82, Issue 1, 2000, Pages 224-228

Glass-to-glass anodic bonding with standard IC technology thin films as intermediate layers

Author keywords

[No Author keywords available]

Indexed keywords

GLASS BONDING; THIN FILMS;

EID: 0033751490     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00376-3     Document Type: Article
Times cited : (99)

References (6)
  • 1
    • 0030738081 scopus 로고    scopus 로고
    • System peaks in capillary zone electrophoresis: II. Experimental study of vacancy peaks
    • Desiderio C., Fanali S., Gebauer P., Bocek P. System peaks in capillary zone electrophoresis: II. Experimental study of vacancy peaks. J. Chromatogr., A. 772:1997;81-89.
    • (1997) J. Chromatogr., a , vol.772 , pp. 81-89
    • Desiderio, C.1    Fanali, S.2    Gebauer, P.3    Bocek, P.4
  • 2
    • 0029419265 scopus 로고
    • Examination of glass-silicon and glass-glass bonding techniques for microfluidic systems
    • Raley N.F., Davidson J.C., Balch J.W. Examination of glass-silicon and glass-glass bonding techniques for microfluidic systems. Proc. SPIE. 2639:1995;40-45.
    • (1995) Proc. SPIE , vol.2639 , pp. 40-45
    • Raley, N.F.1    Davidson, J.C.2    Balch, J.W.3
  • 5
    • 0027611874 scopus 로고
    • Anodic bonding of silicon to silicon wafers coated with aluminium, silicon oxide, polysilicon or silicon nitride
    • Nese M., Hanneborg A. Anodic bonding of silicon to silicon wafers coated with aluminium, silicon oxide, polysilicon or silicon nitride. Sens. Actuators, A. 37-38:1993;61-67.
    • (1993) Sens. Actuators, a , vol.3738 , pp. 61-67
    • Nese, M.1    Hanneborg, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.