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Volumn 7, Issue 2, 2000, Pages 277-282

High field performance of thin-wall spacers in a vacuum gap

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CAMERAS; CHARGE COUPLED DEVICES; DISPLAY DEVICES; ELECTRIC BREAKDOWN; ELECTRODES; FIELD EMISSION CATHODES; MORPHOLOGY; SURFACES; THIN FILM DEVICES; VACUUM; ZIRCONIA;

EID: 0033751268     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/94.841821     Document Type: Article
Times cited : (8)

References (11)
  • 1
    • 0032045643 scopus 로고    scopus 로고
    • FED up with Fat Tubes
    • Babu R. Chalamala, Yi wei and Bruce E. Gnado, "FED up with Fat Tubes", IEEE Spectrum, Vol. 35 (4), pp. 42-49, 1998.
    • (1998) IEEE Spectrum , vol.35 , Issue.4 , pp. 42-49
    • Chalamala, B.R.1    Wei, Y.2    Gnado, B.E.3
  • 2
    • 0024752562 scopus 로고
    • Surface Flashover of Insulators
    • H. C. Miller, "Surface Flashover of Insulators", IEEE Trans. Electr. Insul. Vol. 24, pp765-786, 1989.
    • (1989) IEEE Trans. Electr. Insul. , vol.24 , pp. 765-786
    • Miller, H.C.1
  • 3
    • 0027640830 scopus 로고
    • Flashover of Insulators in Vacuum
    • H. C. Miller, "Flashover of Insulators in Vacuum", IEEE Trans. Electr. Insul., Vol. 28, pp512-527, 1993.
    • (1993) IEEE Trans. Electr. Insul. , vol.28 , pp. 512-527
    • Miller, H.C.1
  • 4
    • 0001599480 scopus 로고
    • Solid Insulators in Vacuum, a Review
    • R. Hawley, "Solid Insulators in Vacuum, A Review", Vacuum, Vol. 24, pp383-390, 1968.
    • (1968) Vacuum , vol.24 , pp. 383-390
    • Hawley, R.1
  • 5
    • 0017504512 scopus 로고
    • Prebreakdown Processes Associated with Surface Flashover of Solid Insulations in Vacuum
    • T. S. Sudarshan and J. D. Cross, "Prebreakdown Processes Associated with Surface Flashover of Solid Insulations in Vacuum", IEEE Trans. Electr. Insul., Vol. 12, pp. 200-208, 1977.
    • (1977) IEEE Trans. Electr. Insul. , vol.12 , pp. 200-208
    • Sudarshan, T.S.1    Cross, J.D.2
  • 7
    • 33749957830 scopus 로고    scopus 로고
    • Information from Candescent Technologies™ web site at http://www.candescent. com/Candescent/ index.htm.
  • 8
    • 0003691703 scopus 로고    scopus 로고
    • Prebreakdown and Breakdown Investigation of Broad Area Electrodes in the Micrometric Regime
    • Ma Xianyun and T. S. Sudarshan, "Prebreakdown and Breakdown Investigation of Broad Area Electrodes in the Micrometric Regime", J. Vac. Sci. Technol. Vol. B16 (3), pp. 1174-1179, 1998.
    • (1998) J. Vac. Sci. Technol. , vol.B16 , Issue.3 , pp. 1174-1179
    • Xianyun, M.1    Sudarshan, T.S.2
  • 9
    • 0017504512 scopus 로고
    • Prebreakdown Processes Associated with Surface Flashover of Solid Insulation in Vacuum
    • T. S. Sudarshan, J. D. Cross and K. D. Srivastava, "Prebreakdown Processes Associated with Surface Flashover of Solid Insulation in Vacuum", IEEE Trans. Electr. Insul. Vol. 12, pp. 200-208, 1977.
    • (1977) IEEE Trans. Electr. Insul. , vol.12 , pp. 200-208
    • Sudarshan, T.S.1    Cross, J.D.2    Srivastava, K.D.3
  • 11
    • 0032312723 scopus 로고    scopus 로고
    • High Field Characteristics of Insulators in the Micrometric Regime Relevant to Field Emission Displays
    • Asheville, NC
    • Ma Xianyun and T. S. Sudarshan, "High Field Characteristics of Insulators in the Micrometric Regime Relevant to Field Emission Displays", Eleventh International Vacuum Microelectronics Conference, Asheville, NC, pp. 57-58, 1998.
    • (1998) Eleventh International Vacuum Microelectronics Conference , pp. 57-58
    • Xianyun, M.1    Sudarshan, T.S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.